NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Zr(O₃PC₁₀H₂₀PO₃)/Si

XPS Formula:

Zr(O₃P*C₁₀H₂₀P*O₃)/Si

Name:

zirconium decanediylbis(phosphonate)/silicon

CAS Registry No:

Class:

non-stoichiometric oxide

Citation:

Author Name(s):

Lee H., Kepley L.J., Hong H.-G., Akhter S., Mallouk T.E.

Journal:

J. Phys. Chem. 92, 2597

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

191.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

4 ML Zr(O3PC10H20PO3)/Si(100). The thickness of film was determined by ellipsometry.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300