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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
zinc telluride
chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:
Marbeuf A., Ballutaud D., Triboulet R., Dexpert H., Lagarde P., and Marfaing Y.
J. Phys. Chem. Solids 50, 975
Pub Year:
1989

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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