NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

P₃N₅Ox

XPS Formula:

nitrogen atoms single bonded to three phosphorus atoms

Name:

phosphorus oxynitride

CAS Registry No:

Class:

IV semiconductor, nitride, non-stoichiometric oxide

Citation:

Author Name(s):

Quan D.T., Le Bloa A., Hbib H., Bonnaud O., Meinel J., Quemerais A., et al.

Journal:

Revue Phys. Appl. 24, 545

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

398.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300