NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CH₂CH(C(O)OH)^-)n

XPS Formula:

(^-CH₂CH(C(O*)O*H)^-)n

Name:

poly(acrylic acid)

CAS Registry No:

9003-01-4

Class:

acid, alcohol, carboxylic acid, hydroxyl(organic), organic acid, oxygen, polymer

Citation:

Author Name(s):

DeKoven B.M., Hagans P.L.

Journal:

Appl. Surf. Sci. 27, 199

DOI:

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

533.30

0.3

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300