NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Al/(^-CH₂CH(C(O)OH)^-)n

73.90

Al/(^-CH₂CH₂^-)

73.20

(^-CH₂CH(C(O)OH)^-)n

284.80

(^-CH₂CH(C(O)OH)^-)n

288.80

Al/(^-CH₂CH(C(O)OH)^-)n

283.30

(^-CH₂CH₂^-)

284.90

Al/(^-CH₂CH₂^-)

283.40

(^-CH₂CH(C(O)OH)^-)n

533.30

Data Processing:

Photoelectron Line

283.30

0.3

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Al was sputter deposited in situ.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300