NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 3

Data Processing:

Photoelectron Line

284.80

0.2

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

1.7

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Polymer film was solvent cast onto Si single crystal wafer or Ta foil substrates from solution of warm water and Elvanol. Film thicknesses were not determined directly, but no Si or Ta peaks were observed in XPS spectra, indicating a film thickness in exc

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300