NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

V

V₂O₅/SiO₂

divanadium pentaoxide/silicon dioxide

CAS Registry No:

1314-62-1

catalyst, oxide

Citation:

Author Name(s):

Nag N.K., Massoth F.E.

J. Catal. 124, 127

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV)

518.80

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

13.7% V2O5/SiO2. The SiO2 was impregnated with aqueous solution containing stoichiometric amounts of ammonium metavanadate. Excess water was evaporated by drying at 393 K for 16 h followed by calcining at 773 K for 4 h in air.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293

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