NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(C₆H₅CHCHC₆H₄CHCHC₆H₅)(AsF₅)₂.₉

XPS Formula:

plasmon energy loss and/or shake^-up satellite and/or charges localized on certain carbon atoms

Name:

1,4-bis[(E)-2-phenylethyl]benzene arsenic pentafluoride

CAS Registry No:

Class:

arsenic, fluoride, organometallic, phenyl benzene, polymer

Citation:

Author Name(s):

King D.E., Fernandez J.E., Swartz W.E.

Journal:

Appl. Surf. Sci. 45, 325

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

289.30

0.2

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.6

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Distyrylbenzene was doped with AsF5.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):