NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CdTe

cadmium telluride

1306-25-8

chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:

Author Name(s):

Kowalczyk S.P., Cheung J.T., Kraut E.A., Grant R.W.

Journal:

Phys. Rev. Lett. 56, 1605

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

10.29

0.030

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

CdTe(-1-1-1).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

293