NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

holmiun

7440-60-0

element

Citation:

Author Name(s):

Singh P., Mandale A.B., Badrinarayanan S.

Journal:

J. Less-common Metals 141, 1

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

159.00

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The sample was cleaned by Ar+ ion bombardment ( j = 60 microamperes cm-2) and subsequently annealed.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293