NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

V₂O₂(P₂O₇)

V*₂O₂(P₂O₇)

bis(oxovanadium(IV)) diphosphate

CAS Registry No:

58834-75-6

Class:

double oxide, oxide, phosphate

Citation:

Author Name(s):

Moser T.P., Schrader G.L.

Journal:

J. Catal. 104, 99

DOI:

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

516.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.0

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293