Tab Page Summary
III-V semiconductor, phosphide
Trafas B.M., Aldao C.M., Capasso C., Shapira Y., Boscherini F., Vitomirov I.M.
Surface Core-level Shift for the Second Layer of Atoms
mixed Gaussian/Lorentzian
Anode Material:
other source
Overall Energy Resolution (eV):
0.4
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
2.6 A Ce/InP(110). Evaporation of Ce was measured with a quartz crystal monitor and was about 1 A/min.
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293