NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(=(C₁₀H₂O₄)=N^-(C₆H₄)^-O^-(C₆H₄)^-N=)n

XPS Formula:

carbon atoms attached to N or O atoms

Name:

poly(N,N'-(p,p'-oxydiphenylene)pyromellitimide)

CAS Registry No:

25036-53-7

Class:

anhydride, ether, imide, multiple rings, nitrogen, other ring, oxygen, phenyl benzene, polymer, sulfur

Citation:

Author Name(s):

Atanasoska L., Anderson S.G., Meyer III H.M., Lin Z., Weaver J.H.

Journal:

J. Vac. Sci. Technol. A 5, 3325

DOI:

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Photoelectron Line

285.80

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

0.95

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The thickness of the cured polyimide films was uniform and determined by ellipsometry and was measured to be 200+-20 A.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293