NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 11

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

(^-Si(CH₃)₂O^-)n

153.20

(^-Si(CH₃)₂O^-)n

102.40

(^-Si(CH₃)₂O^-)n

532.50

(^-C₆H₄S(O)₂C₆H₄O^-)n

231.70

(^-C₆H₄S(O)₂C₆H₄O^-)n

167.40

(^-C₆H₄S(O)₂C₆H₄O^-)n

532.30

(^-C₈H₂N₂S₂C₆H₄^-)n

228.20

(^-C₈H₂N₂S₂C₆H₄^-)n

164.00

(^-C₈H₂N₂S₂C₆H₄^-)n

398.50

(^-CH₂CH(Cl)^-)n

270.10

(^-CH₂CH(Cl)^-)n

199.50

Data Processing:

Photoelectron Line

167.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293