There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
silicon
element, II-VI semiconductor, IV semiconductor

Citation:
Bringans R.D., Olmstead M.A., Uhrberg R.I.G., Bachrach R.Z.
Phys. Rev. B 36, 9569
Pub Year:
1987

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
130
Overall Energy Resolution (eV):
0.3
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Si(100)-(2x1).

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

An error has occurred. This application may no longer respond until reloaded. Reload 🗙