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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Cs/GaAs
cesium/gallium arsenide
element

Citation:
Kendelewicz T., Soukiassian P., Bakshi M.H., Hurych Z., Lindau I., and Spicer W. E.
Phys. Rev. B 38, 7568
Pub Year:
1988

Data Processing:
Interface Core-Level Shift
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
0.45 ML Cs/GaAs(100), cleaved surface. Branching ratio is 1.4.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

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