NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

AlOx/Al

Al*Ox/Al

aluminum oxides/aluminum

CAS Registry No:

7429-90-5

Class:

anhydride, catalyst, element, non-stoichiometric oxide, oxide

Citation:

Author Name(s):

Halverson D.E., Cocke D.L.

Journal:

Thin Solid Films 155, 133

DOI:

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Chemical Shift

CS-2p

3.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Al2p=72.87

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

A plasma grown oxide at 687 K. The Al2p spectrum contains only one peak.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293