NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

WOx/W

WOx/W*

tungsten oxides/tungsten

CAS Registry No:

Class:

non-stoichiometric oxide, oxide

Citation:

Author Name(s):

Kojima I., Kurahashi M.

Journal:

J. Electron Spectrosc. Relat. Phenom. 42, 177

DOI:

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

31.37

Background Subtraction Method:

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.39

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, W4f7 = 31.37

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The total FWHM is 1.39 eV. Branching ratio = 0.76. Asymmetry parameter = -0.21.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300