NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Yb/InP

Yb/InP*

ytterbium/indium phosphide

CAS Registry No:

22398-80-7

Class:

element, IV-VI semiconductor, lanthanide, phosphide, rare earth

Citation:

Author Name(s):

de Padova P., Jin X.F., Carriere B., Pinchaux R.

Journal:

Surf. Sci. 211, 675

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Chemical Shift

CS-2p_3/2

0.50

0.1

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

160

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.11-3.5 ML Yb/InP.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293