NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

WS₂

W*S₂

tungsten disulfide

12138-09-9

catalyst, chalcogenide, IV-VI semiconductor, sulfide

Citation:

Author Name(s):

Jaegermann W., Ohuchi F.S., Parkinson B.A.

Journal:

Surf. Sci. 201, 211

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

33.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

0.6

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

n-type WS2(0001) single crystal unintentinally doped at 1E17 cm-3

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300