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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Pd
Formula:
Pd84.5Si15.5
XPS Formula:
Pd*84.5Si15.5
Name:
palladium silicon alloy (84.5-15.5)
CAS Registry No:
Class:
alloy

Citation:
Author Name(s):
Pflugi A., Indlekofer G., Oelhafen P.
Journal:
J. Non-cryst. Solids 117, 336
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Chemical Shift
Line Designation:
CS-3d5/2
Chemical Shift (eV)
0.45
Energy Uncertainty:
0.03
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.31
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
1.0
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The samples have been prepared from ingots of a purity of 99.99% or higher. The constituents have been alloyed under UHV conditions in a Mo crucible which was Ar sputtered in order to achive a perfect wedding.The surface composition determined by XPS was determined by XPS was Pd80Si20.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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