NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CdTe

CdTe*

cadmium telluride

1306-25-8

chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:

Author Name(s):

Faurie J.P., Hsu C., Duc T.M.

Journal:

J. Vac. Sci. Technol. A 5, 3074

DOI:

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4d_5/2

39.36

0.04

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300