NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

P₄Se₃

XPS Formula:

P₄Se*₃ intramolecularly bonded selenium

Name:

tetraphosphorus triselenide

CAS Registry No:

1314-86-9

Class:

glass, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Rollo J.R., Burns G.R., Robinson W.T., Clark R.J.H., Dawes H.M., and Hursthouse M.B.

Journal:

Inorg. Chem. 29, 2889

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_3/2

55.40

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Alpha-P4Se3. Samples were ground into a powder and spread onto indium foil immediately before being introduced into the spectrometer.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300