NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Mo₆Se₈(P(C₂H₅)₃)₆

Mo*₆Se₈(P(C₂H₅)₃)₆

hexakis(triethylphosphine) octaselenium hexamolibdenum

CAS Registry No:

Class:

cluster, organometallic, selenide

Citation:

Author Name(s):

Saito T., Kajitani Y., Yamagata T., Imoto H.

Journal:

Inorg. Chem. 29, 2951

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_3/2

231.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300