NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

PbTe

lead telluride

1314-91-6

chalcogenide, IV-VI semiconductor, telluride

Citation:

Author Name(s):

Lai B., Wells G.M., Cerrina F., Anderson J.R., Papagno L., and Lapeyre G.J.

Journal:

J. Vac. Sci. Technol. A 4, 977

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4d_5/2

39.56

0.05

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

1.01

Lorentzian Width (eV):

0.38

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.4

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Branching ratio = 0.74

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293