NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

MoSi₂

Mo*Si₂

molybdenum disilicide

CAS Registry No:

12136-78-6

Class:

IV-VI semiconductor, silicide

Citation:

Author Name(s):

Hirose K., Ohdomari I., Uda M.

Journal:

Phys. Rev. B 37, 6929

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Chemical Shift

CS-3d_5/2

-0.30

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.1

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300