NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆H₅(C₄H₂N₂S)NHSO₂C₆H₅

XPS Formula:

N in ring attached to N in sulfonamido group

Name:

4-phenyl-1-(phenylsulfonamido)-1H-pyrimidine-2-thione

CAS Registry No:

Class:

amine, nitrogen, other ring, phenyl benzene, sulfonyl, sulfur

Citation:

Author Name(s):

Doring M., Uhlig E., Nefedov V.I., Salin I.V.

Journal:

Z. Anorg. Allg. Chem. 563, 105

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

401.70

0.3

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

1-benzenesulfonoamido-4-phenyl-2(1H)pyrimidinthion

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300