NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(C₆H₅NHC(S)NHNSO₂C₆H₅)₂Ni

XPS Formula:

S in =SO₂ group

Name:

bis(4-phenyl-1-(phenylsulfonyl)-3-thiosemicarbazide) nickel

CAS Registry No:

Class:

amine, nitrogen, organometallic, phenyl benzene, sulfonyl, sulfur

Citation:

Author Name(s):

Doring M., Uhlig E., Nefedov V.I., Salin I.V.

Journal:

Z. Anorg. Allg. Chem. 563, 105

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.00

0.3

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300