NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

PdF₂

Pd*F₂

palladium(II) difluoride

CAS Registry No:

13444-96-7

Class:

fluoride

Citation:

Author Name(s):

Tressaud A., Khairoun S., Touhara H., Watanabe N.

Journal:

Z. Anorg. Allg. Chem. 540, 291

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2, sat

340.40

0.4

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

2.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

High pressure PdF2.

Specimen:

Method of Determining Specimen Composition:

X-ray Diffraction

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300