There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
S
Formula:
[Cu(S2CN(C2H5)2)2]
XPS Formula:
[Cu(S*2CN(C2H5)2)2]
Name:
copper bis(diethyl dithiocarbamate)
CAS Registry No:
Class:
thiourea

Citation:
Author Name(s):
Healy P.C., Myhra S., Stewart A.M.
Journal:
Jpn. J. Appl. Phys. Part 2 26, L1884
DOI:
Pub Year:
1987

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
161.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Fresh and clean surfaces were prepared by grinding the powdered specimens. Copper is in bivalent state.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙