NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CdIn₂S₂Se₂

CdIn₂S*₂Se₂

cadmium diindium disulfur diselenium

CAS Registry No:

106829-31-6

Class:

chalcogenide, III-V semiconductor, selenide, sulfide

Citation:

Author Name(s):

Malitesta C., Centonze D., Sabbatini L., Zambonin P.G., Bicelli L.P., and Maffi S.

Journal:

J. Mater. Chem. 1, 259

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

226.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.2

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was CdIn2.1S2.1Se1.8.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300