NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

HgO

Hg*O

mercury(II) oxide

21908-53-2

oxide

Citation:

Author Name(s):

Humbert P.

Journal:

Solid State Commun. 60, 21

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_5/2

104.78

0.05

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The metal oxygen/ratio derived from the Hg4f7/2 and O1s peak areas using the tabulated atomic sensitivity factors, was found to be 1.18.

Specimen:

Method of Determining Specimen Composition:

X-ray Diffraction

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300