NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

N₂/K/InP

InPNx

nitrogen/potassium/indium phosphide

CAS Registry No:

Class:

III-V semiconductor, nitride, phosphide

Citation:

Author Name(s):

Soukiassian P., Starnberg H.I., Kendelewicz T.

Journal:

Appl. Surf. Sci. 56, 772

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Chemical Shift

CS-2p

1.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1E3 L and 4E3 L N2/1ML K/InP(110). The energy is referenced to the bulk state of the P2p line.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300