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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ti
Formula:
TiOS
XPS Formula:
atoms with a [TiS6] octahedral environment
Name:
titanium oxysulfide(TiOS)
CAS Registry No:
Class:
oxide, sulfide

Citation:
Author Name(s):
Gonbeau D., Guimon C., Pfister-Guillouzo G., Levasseur A., Meunier G., and Dormoy R.
Journal:
Surf. Sci. 254, 81
DOI:
Pub Year:
1991

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
456.50
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The surface after mechanical erosion. The relative intensity was 0.15. The total FWHM is 1.51 eV

Specimen:
Specimen:
Method of Determining Specimen Composition:
Rutherford Backscattering Spectrometry
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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