NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

TiOS

XPS Formula:

disulfide ((S₂)₂^-) sulfur atoms

Name:

titanium oxysulfide(TiOS)

CAS Registry No:

Class:

oxide, sulfide

Citation:

Author Name(s):

Gonbeau D., Guimon C., Pfister-Guillouzo G., Levasseur A., Meunier G., and Dormoy R.

Journal:

Surf. Sci. 254, 81

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_1/2

163.60

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The surface after mechanical erosion. The relative intensity was 0.35. The total FWHM is 1.06 eV

Specimen:

Method of Determining Specimen Composition:

Rutherford Backscattering Spectrometry

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300