NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

InP

InP*

indium phosphide

22398-80-7

II-VI semiconductor, III-V semiconductor, phosphide

Citation:

Author Name(s):

Waldrop J.R., Grant R.W., Kraut E.A.

Journal:

Appl. Phys. Lett. 54, 1878

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

128.24

0.03

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300