NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

W₂O₂(S₂)(S₂CN(C₂H₅)₂)₂

XPS Formula:

S in dithiocarbamate ligand

Name:

di-mu-thio-bis(oxotungsten) bis(diethyldithiocarbamate)

CAS Registry No:

Class:

oxygen ligand, sulfur, sulfur ligand, thiourea

Citation:

Author Name(s):

Ansari M.A., Chandrasekaran J., Sarkar S.

Journal:

Bull. Chem. Soc. Jpn. 61, 2265

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

162.90

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300