There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
W
Formula:
W2S2(S2)(S2CN(C2H5)2)2
XPS Formula:
W*2O2(nu-S2)(S2CN(C2H5)2)2
Name:
di-mu-thio-bis(thiotungsten) bis(diethyldithiocarbamate)
CAS Registry No:
Class:
sulfur, sulfur ligand, thiourea

Citation:
Author Name(s):
Ansari M.A., Chandrasekaran J., Sarkar S.
Journal:
Bull. Chem. Soc. Jpn. 61, 2265
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f5/2
Binding Energy (eV)
35.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
W2S2(nu-S2)(S2CN(C2H5)2)2

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙