NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Cu₂S

copper(I) sulfide

22205-45-4

chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Gebhardt J.E., McCarron J.J., Richardson P.E., Buckley A.N.

Journal:

Hydrometallurgy 17, 27

DOI:

Pub Year:

1986

book All Records in this Publication

Data Processing:

Auger-Electron Line

L₃M₄₅M₄₅(¹G)

917.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67, CuLVV = 568.1

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Abraded Cu2S. Chalcocite.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300