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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Pd
Formula:
Pd/SiOx/Si
Name:
palladium/silicon oxides/silicon
CAS Registry No:
7440-05-3
Class:
catalyst, element

Citation:
Author Name(s):
Schleich B., Schmeisser D., Gopel W.
Journal:
Surf. Sci. 191, 357
DOI:
Pub Year:
1987

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d5/2
Binding Energy (eV)
334.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, Si2p = 99.34
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
1.0 nm Pd/2 nm SiOx/ p-type B-doped Si(111) with a resistivity of 6 ohm cm. Pd was deposited at 100 K. The chemically clean SiOx surface wasprepared by heating the sample (T = 850 K, time = 2min). The thicknesses were measured using a quartz-crystal thick

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
100
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