NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

SiO₂,quartz

SiO*₂

silicon(IV) dioxide (Quartz)

CAS Registry No:

60676-86-0

Class:

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:

Author Name(s):

Netterfield R.P., Martin P.J., Pacey C.G., Sainty W.G., McKenzie D.R., et al.

Journal:

J. Appl. Phys. 66, 1805

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Photoelectron Line

532.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300