NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C₆H₅SH/Ni

physisorbed thiol

benzenethiol/nickel

108-98-5

carbide, element, phenyl benzene, sulfur, thiol

Citation:

Author Name(s):

Rufael T.S., Huntley D.R., Mullins D.R., Gland J.L.

Journal:

J. Phys. Chem. 98, 13022

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

164.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

250

Overall Energy Resolution (eV):

0.30

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

C6H5SH/Ni(111).The substrate was cleaned by Ne+ ion bombardment and subsequently annealed (T = 1000 K, time = 1 min).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

100