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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
Al3N5O3Si3
Name:
silicon nitride aluminum oxide aluminum nitride ss(Al3N5O3Si3)
CAS Registry No:
Class:
nitride, oxide, solid solution

Citation:
Author Name(s):
Hagio T., Takase A., Umebayashi S.
Journal:
J. Mater. Sci. Lett. 11, 878
DOI:
Pub Year:
1992

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV)
101.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
2.7
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Argon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sialon was obtained by hot-pressing mixtures in the system Si3N4 and Al2O3.AlN at 2073 K for 1 h at a pressure of 20 MPa under 1 atm N2. The sample was cleaned by Ar+ ion bombardment (Ep = 400 eV, time = 200 s). No Ar+ ion-induced damage to the sample

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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