NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 22

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

AlN₇OSi₅

101.60

AlN₇OSi₅

74.50

AlN₇OSi₅

532.20

AlN₇OSi₅

397.40

Al₂N₆O₂Si₄

101.70

Al₂N₆O₂Si₄

74.50

Al₂N₆O₂Si₄

532.00

Al₂N₆O₂Si₄

397.20

Al₃N₅O₃Si₃

101.70

Al₃N₅O₃Si₃

74.50

Al₃N₅O₃Si₃

531.80

Al₃N₅O₃Si₃

397.00

Al₄N₄O₄Si₂

101.70

Al₄N₄O₄Si₂

74.50

Al₄N₄O₄Si₂

531.60

Al₄N₄O₄Si₂

396.80

SiO₂

103.10

SiO₂

532.50

AlN

73.10

AlN

396.20

(MgO)₀.₀₄₇Si₃N₄

101.70

(MgO)₀.₀₄₇Si₃N₄

397.70

Data Processing:

Photoelectron Line

396.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.2

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Argon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was cleaned by Ar+ ion bombardment (Ep = 400 eV, time = 200 s). No Ar+ ion-induced damage to the sample was detected.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300