NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

NiSiO₃

nickel(II) silicate

double oxide, oxide, silicate

Citation:

Author Name(s):

Gonzalez-Elipe A.R., Alvarez R., Holgado J.P., Espinos J.P., Munuera G., and Sanz J.M.

Journal:

Appl. Surf. Sci. 51, 19

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

532.00

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was heated in vacuum at increasing temperature up to 873 K for 1 h.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300