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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiC1.3
silicon carbide(SiC1.3)
109166-35-0
carbide

Citation:
Delplancke M.P., Powers J.M., Vandentop G.J., Salmeron M., Somorjai G.A.
J. Vac. Sci. Technol. A 9, 450
Pub Year:
1991

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The film was prepared at 573 K.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

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