NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C₆H₅NHC₆H₄NHC₆H₅

all carbon atoms

N,N'-diphenyl-1,4-phenylenediamine

CAS Registry No:

Class:

amine, nitrogen, phenyl benzene

Citation:

Author Name(s):

Sjogren B., Salaneck W.R., Stafstrom S.

Journal:

J. Chem. Phys. 97, 137

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Photoelectron Line

285.40

0.02

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The film thickness determined by XPS was ~100 A.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300