NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₁₀₀H₁₆₀Br₄CuN₁₂/Si

XPS Formula:

trivalent nitrogen atoms belonging to the main part of the macrocycle

Name:

2,9,16,23-tetraoctadecyl-29H,31H-tetrapyridol[3,4-b:3',4'-g:3",4"-l:3''',4'''-q]porphyraziniumatocopper tetrabromide/silicon

CAS Registry No:

104574-70-1

Class:

bromide, nitrogen, organometallic, other ring, superconductor

Citation:

Author Name(s):

Carniato S., Roulet H., Dufour G., Palacin S., Barraud A., Millie P., et al.

Journal:

J. Phys. Chem. 96, 7072

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Photoelectron Line

398.50

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Langmuir - Blodgett films with thicknesses of 3, 20, 45, and 100 ML. The relative intensity was 0.35. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300