NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

C₃₂H₂₉CuN₄Na₃O₆

398.60

C₃₂H₁₆CuN₈

398.60

C₁₀₀H₁₆₀Br₄CuN₁₂/Si

398.60

C₁₀₀H₁₆₀Br₄CuN₁₂/Si

400.40

C₁₀₀H₁₆₀Br₄CuN₁₂/Si

398.50

C₁₀₀H₁₆₀Br₄CuN₁₂/Si

399.80

C₄₀H₂₄CuN₈

398.60

C₂₈H₁₂CuN₁₂

398.60

Data Processing:

Photoelectron Line

399.80

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Langmuir - Blodgett films with thicknesses of 3, 20, 45, and 100 ML. The relative intensity was 0.35. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300