NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-C₆H₃(SO₃)NHC₆H₄NHC₆H₃(SO₃)NH^-)n

XPS Formula:

radical cationic nitrogen atoms

Name:

poly(aniline) sulfonate

CAS Registry No:

Class:

amine, aniline, nitrogen, phenyl benzene, polymer

Citation:

Author Name(s):

Yue J., Epstein A.J.

Journal:

Macromolecules 24, 4441

DOI:

Pub Year:

1991

book All Records in this Publication

Data Processing:

Photoelectron Line

400.50

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.8

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The relative intensity was 0.5. The total FWHM is 1.8 eV.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300